Methods for trace element analysis, like atomic absorption spectroscopy (AAS) or inductively-coupled plasma spectroscopy (ICP), are well established, but are often limited by sample quantity, the necessity for sample digestion, lengthy sample preparation and complex matrix effects.
Total reflection X-ray fluorescence (TXRF) spectrometry is an analytical method that is very sensitive to ultra-low concentrations of elements in even minute sample amounts. It is capable of analyzing nanogram sample amounts with element concentrations ranging from 0.1 ppb to 100%. The S2 PICOFOX benchtop TXRF spectrometer is compact, portable and needs no expensive consumables. Learn how TXRF can save you time by performing trace element analysis of any sample type, without the wait for sample preparation.
During this one-hour interactive webinar, we present application examples from food industry and clinical and environmental research institutes. We explore TXRF's many benefits for the detection of toxic impurities and present new findings about the function of essential elements. In addition the fast TXRF sample preparation is compared with procedures required for AAS and ICP analysis.
Register today to discover truly efficient trace element analysis with TXRF!