Imagine you can determine the elemental composition of a sample without preparation. No need to polish to produce a flat, homogeneous surface, or otherwise grind, dissolve or cut sample material. Irregular-shaped specimens aren’t a problem and measurement is non-destructive so the sample isn’t damaged. Micro X-ray fluorescence (micro-XRF) spectroscopy offers exactly this and more.
This Essential Knowledge Briefing provides a general introduction to the technique, explains how it works and provides examples of what it can do. It also outlines practical issues related to the method, describes potential problems that could arise and how to solve them, and reveals forthcoming advances.